On June 15, 2015, we took delivery of our new Hitachi SU3500 Variable Pressure Scanning Electron Microscope combined with an Oxford AZtec X-Max50 SDD energy dispersive detector. The SEM can be run in standard high vacuum mode and provides standard high resolution images and EDS micro analysis. The SU3500 can also operate at low pressures from 6 Pa to 650 Pa. This new capability will allow us to directly examine non-conductive samples, such as polymers, corrosion products and minerals, without the need for gold or platinum coatings.
The SU3500 is equipped with a standard secondary electron (SE) detector, a backscattered electron (BSE) detector and a SE equivalent ultra variable-pressure detector (UVD). The UVD is designed to image samples at low pressures and low accelerating voltages. The SEM also has a large sample chamber and a five-axis motorized stage capable of holding an 8 kg sample.
The system is combined with an Oxford AZtec large area (50 mm2) silicon drift detector (SDD) that provides fast elemental analyses, mapping and line scans. Included with the EDS system is AZtecFeature, an analysis software package designed for particle analysis and identification.
Surface Science Western 
